Integrated circuit radiated emissions

The objective of this project is to measure radiated emission of integrated circuit (IC) by a test jig and field scanner. The test jig that will be set up for this project would be a closed Transverse Electro-Magnetic (TEM) cell. Using the TEM cell radiated emission of the IC-under-test will be meas...

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Main Author: Lim, Jian Xin
Other Authors: See Kye Yak
Format: Final Year Project
Language:English
Published: 2014
Subjects:
Online Access:http://hdl.handle.net/10356/60854
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Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-60854
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spelling sg-ntu-dr.10356-608542023-07-07T16:03:32Z Integrated circuit radiated emissions Lim, Jian Xin See Kye Yak School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging The objective of this project is to measure radiated emission of integrated circuit (IC) by a test jig and field scanner. The test jig that will be set up for this project would be a closed Transverse Electro-Magnetic (TEM) cell. Using the TEM cell radiated emission of the IC-under-test will be measured. The IC-under-test will also undergo measurement using near field scanner. Comprehensive analysis will be carried out to co-relate the result from the TEM cell and the scanner. Bachelor of Engineering 2014-06-02T03:39:02Z 2014-06-02T03:39:02Z 2014 2014 Final Year Project (FYP) http://hdl.handle.net/10356/60854 en Nanyang Technological University 50 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging
Lim, Jian Xin
Integrated circuit radiated emissions
description The objective of this project is to measure radiated emission of integrated circuit (IC) by a test jig and field scanner. The test jig that will be set up for this project would be a closed Transverse Electro-Magnetic (TEM) cell. Using the TEM cell radiated emission of the IC-under-test will be measured. The IC-under-test will also undergo measurement using near field scanner. Comprehensive analysis will be carried out to co-relate the result from the TEM cell and the scanner.
author2 See Kye Yak
author_facet See Kye Yak
Lim, Jian Xin
format Final Year Project
author Lim, Jian Xin
author_sort Lim, Jian Xin
title Integrated circuit radiated emissions
title_short Integrated circuit radiated emissions
title_full Integrated circuit radiated emissions
title_fullStr Integrated circuit radiated emissions
title_full_unstemmed Integrated circuit radiated emissions
title_sort integrated circuit radiated emissions
publishDate 2014
url http://hdl.handle.net/10356/60854
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