Development of UV photodetector structures on silicon

AlxGa1-xN based UV photodetectors on Si samples grown by RF-MBE technique were characterized to study the effects of varying Al % composition on the optical and structural properties of the samples. Photoluminescence (PL), X-Ray Diffraction (XRD), Microscope and Scanning Electron Microscope (SEM) we...

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Bibliographic Details
Main Author: Muhammad Osman
Other Authors: K. Radhakrishnan
Format: Final Year Project
Language:English
Published: 2014
Subjects:
Online Access:http://hdl.handle.net/10356/60882
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Institution: Nanyang Technological University
Language: English
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