Modeling of test structures for applications in EM shielding

• المؤلف الرئيسي: Lim, York Ying
• مؤلفون آخرون: Tay Beng Kang
• التنسيق: Final Year Project
• اللغة: English
• منشور في: 2015
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/63854

The next generation of components and devices are reduced in size, which makes the circuit more compact that will affect the signal integrity. One of the current techniques used for RF isolation is by implementing via fence guard trace in compact circuitries to isolate near end interference. However...