Modeling of test structures for applications in EM shielding

• 主要作者: Lim, York Ying
• 其他作者: Tay Beng Kang
• 格式: Final Year Project
• 語言: English
• 出版: 2015
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
• 在線閱讀: http://hdl.handle.net/10356/63854
• 機構: Nanyang Technological University

The next generation of components and devices are reduced in size, which makes the circuit more compact that will affect the signal integrity. One of the current techniques used for RF isolation is by implementing via fence guard trace in compact circuitries to isolate near end interference. However...