Void density investigation of low temperature InP (chip) /Al2O3/Si (wafer) direct bonding

Silicon photonics has attracted extensive research attention due to its advantages of lower single delay and power consumption, higher level of integration and, as a consequence, more diversifiedfunctionalities. However, InP on Si direct wafer bonding, as one of the promising approach to achieve III...

Full description

Saved in:
Bibliographic Details
Main Author: Shang, Ling Ru
Other Authors: Tang Xiao Hong
Format: Final Year Project
Language:English
Published: 2015
Subjects:
Online Access:http://hdl.handle.net/10356/64062
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English