A 40nm CMOS current reference with reduced PVT sensitivity

A reference current is a vital building block for an analog circuit. Most often, the current reference determines the biasing point of the circuits, thereby influencing the ultimate performance of the circuitries. In this work, an improved foundation current reference with dynamic element matching (...

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Main Author: Prabhakar Bharath Kumar
Other Authors: Chan Pak Kwong
Format: Theses and Dissertations
Language:English
Published: 2018
Subjects:
Online Access:http://hdl.handle.net/10356/73108
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-731082023-07-04T15:53:16Z A 40nm CMOS current reference with reduced PVT sensitivity Prabhakar Bharath Kumar Chan Pak Kwong School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering A reference current is a vital building block for an analog circuit. Most often, the current reference determines the biasing point of the circuits, thereby influencing the ultimate performance of the circuitries. In this work, an improved foundation current reference with dynamic element matching (DEM) technique in 40nm CMOS technology is proposed. Not only does it improve the reported circuits in terms of process, supply voltage and temperature variations, it also enhances the immunity against the stress-induced offset arising from the stress effect on the matching pairs in the current reference circuits. The proposed work aims at designing a reference current of 2.5uA which operates with a minimum supply voltage of 1.1 V and in the temperature range of -20°C to 100°C. The extensive Monte-Carlo simulations are conducted and the results are compared with that of the prior-art works. It has shown that the proposed current reference circuit out-performs the reported works in the aspect of many performance metrics. Master of Science (Electronics) 2018-01-03T06:04:44Z 2018-01-03T06:04:44Z 2018 Thesis http://hdl.handle.net/10356/73108 en 66 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Prabhakar Bharath Kumar
A 40nm CMOS current reference with reduced PVT sensitivity
description A reference current is a vital building block for an analog circuit. Most often, the current reference determines the biasing point of the circuits, thereby influencing the ultimate performance of the circuitries. In this work, an improved foundation current reference with dynamic element matching (DEM) technique in 40nm CMOS technology is proposed. Not only does it improve the reported circuits in terms of process, supply voltage and temperature variations, it also enhances the immunity against the stress-induced offset arising from the stress effect on the matching pairs in the current reference circuits. The proposed work aims at designing a reference current of 2.5uA which operates with a minimum supply voltage of 1.1 V and in the temperature range of -20°C to 100°C. The extensive Monte-Carlo simulations are conducted and the results are compared with that of the prior-art works. It has shown that the proposed current reference circuit out-performs the reported works in the aspect of many performance metrics.
author2 Chan Pak Kwong
author_facet Chan Pak Kwong
Prabhakar Bharath Kumar
format Theses and Dissertations
author Prabhakar Bharath Kumar
author_sort Prabhakar Bharath Kumar
title A 40nm CMOS current reference with reduced PVT sensitivity
title_short A 40nm CMOS current reference with reduced PVT sensitivity
title_full A 40nm CMOS current reference with reduced PVT sensitivity
title_fullStr A 40nm CMOS current reference with reduced PVT sensitivity
title_full_unstemmed A 40nm CMOS current reference with reduced PVT sensitivity
title_sort 40nm cmos current reference with reduced pvt sensitivity
publishDate 2018
url http://hdl.handle.net/10356/73108
_version_ 1772825740685869056