Analysis of memory BIST architecture flow

• المؤلف الرئيسي: Sharma, Anmol
• مؤلفون آخرون: Chang Chip Hong
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2018
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/76070

The burgeoning amount and complexity of memories in modern SoC have brought forth new challenges in memory testing. Memory Built-in self-test (BIST) is the most widely used solution for memory testing. MBIST is defined as a method used for insertion of embedded memory controllers inside the chip to...