Molecular adhesion controlled microelectromechanical memory device for harsh environment data storage

This work demonstrates a cantilever based electrostatic microelectromechanical system device operating as a memory element. Volatile and non-volatile functions are engineered by manipulating molecular adhesion force through contact dimples and restoring force using the cantilever design. For non-vol...

Full description

Saved in:
Bibliographic Details
Main Authors: Chua, Geng Li, Singh, Pushpapraj, Soon, Bo Woon, Liang, Ying Shun, Jayaraman, Karthik Gopal, Singh, Navab, Kim, Tony Tae-Hyoung
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2015
Subjects:
Online Access:https://hdl.handle.net/10356/81211
http://hdl.handle.net/10220/39210
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-81211
record_format dspace
spelling sg-ntu-dr.10356-812112020-03-07T13:57:24Z Molecular adhesion controlled microelectromechanical memory device for harsh environment data storage Chua, Geng Li Singh, Pushpapraj Soon, Bo Woon Liang, Ying Shun Jayaraman, Karthik Gopal Singh, Navab Kim, Tony Tae-Hyoung School of Electrical and Electronic Engineering Microelectrochemical systems Electrodes Magnetic storage devices Adhesion Electrostatics This work demonstrates a cantilever based electrostatic microelectromechanical system device operating as a memory element. Volatile and non-volatile functions are engineered by manipulating molecular adhesion force through contact dimples and restoring force using the cantilever design. For non-volatile RESET operation, a method of detaching the cantilever with 3 V pulsating DC signal at 1 MHz is proposed. SET/RESET cycles are performed up to 103 times at 300 °C without any performance degradation. A writing speed of up to 0.94 μs is achieved, which is faster than conventional high temperature flash memories. With demonstrated attributes, the fabricated device offers excellent potential for harsh environment data storage applications. ASTAR (Agency for Sci., Tech. and Research, S’pore) Published version 2015-12-23T01:21:44Z 2019-12-06T14:23:44Z 2015-12-23T01:21:44Z 2019-12-06T14:23:44Z 2014 Journal Article Chua, G. L., Singh, P., Soon, B. W., Liang, Y. S., Jayaraman, K. G., Kim, T. T.-H., et al. (2014). Molecular adhesion controlled microelectromechanical memory device for harsh environment data storage. Applied Physics Letters, 105(11), 113503-. 0003-6951 https://hdl.handle.net/10356/81211 http://hdl.handle.net/10220/39210 10.1063/1.4895578 en Applied Physics Letters © 2014 American Institute of Physics (AIP). This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics (AIP). The published version is available at: [http://dx.doi.org/10.1063/1.4895578]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 6 p. application/pdf
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic Microelectrochemical systems
Electrodes
Magnetic storage devices
Adhesion
Electrostatics
spellingShingle Microelectrochemical systems
Electrodes
Magnetic storage devices
Adhesion
Electrostatics
Chua, Geng Li
Singh, Pushpapraj
Soon, Bo Woon
Liang, Ying Shun
Jayaraman, Karthik Gopal
Singh, Navab
Kim, Tony Tae-Hyoung
Molecular adhesion controlled microelectromechanical memory device for harsh environment data storage
description This work demonstrates a cantilever based electrostatic microelectromechanical system device operating as a memory element. Volatile and non-volatile functions are engineered by manipulating molecular adhesion force through contact dimples and restoring force using the cantilever design. For non-volatile RESET operation, a method of detaching the cantilever with 3 V pulsating DC signal at 1 MHz is proposed. SET/RESET cycles are performed up to 103 times at 300 °C without any performance degradation. A writing speed of up to 0.94 μs is achieved, which is faster than conventional high temperature flash memories. With demonstrated attributes, the fabricated device offers excellent potential for harsh environment data storage applications.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Chua, Geng Li
Singh, Pushpapraj
Soon, Bo Woon
Liang, Ying Shun
Jayaraman, Karthik Gopal
Singh, Navab
Kim, Tony Tae-Hyoung
format Article
author Chua, Geng Li
Singh, Pushpapraj
Soon, Bo Woon
Liang, Ying Shun
Jayaraman, Karthik Gopal
Singh, Navab
Kim, Tony Tae-Hyoung
author_sort Chua, Geng Li
title Molecular adhesion controlled microelectromechanical memory device for harsh environment data storage
title_short Molecular adhesion controlled microelectromechanical memory device for harsh environment data storage
title_full Molecular adhesion controlled microelectromechanical memory device for harsh environment data storage
title_fullStr Molecular adhesion controlled microelectromechanical memory device for harsh environment data storage
title_full_unstemmed Molecular adhesion controlled microelectromechanical memory device for harsh environment data storage
title_sort molecular adhesion controlled microelectromechanical memory device for harsh environment data storage
publishDate 2015
url https://hdl.handle.net/10356/81211
http://hdl.handle.net/10220/39210
_version_ 1681045178471677952