Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization

• Main Authors: Gan, C. L., Lewis, D., Infante, F., Perdu, P., Kor, H. B.
• Other Authors: School of Materials Science & Engineering
• Format: Article
• Language: English
• Published: 2011
• Subjects: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
• Online Access: https://hdl.handle.net/10356/85280; http://hdl.handle.net/10220/7243
• Institution: Nanyang Technological University

Magnetic microscopy has proven its usefulness throughout the years. It allows current localization with a certain degree of precision by using an inversion algorithm to invert the Biot–Savart law. The goal is to obtain the current distribution once the magnetic field is given. However, in order to o...