Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization

Magnetic microscopy has proven its usefulness throughout the years. It allows current localization with a certain degree of precision by using an inversion algorithm to invert the Biot–Savart law. The goal is to obtain the current distribution once the magnetic field is given. However, in order to o...

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Main Authors: Gan, C. L., Lewis, D., Infante, F., Perdu, P., Kor, H. B.
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2011
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Online Access:https://hdl.handle.net/10356/85280
http://hdl.handle.net/10220/7243
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-852802023-07-14T15:44:50Z Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization Gan, C. L. Lewis, D. Infante, F. Perdu, P. Kor, H. B. School of Materials Science & Engineering DRNTU::Engineering::Materials::Microelectronics and semiconductor materials Magnetic microscopy has proven its usefulness throughout the years. It allows current localization with a certain degree of precision by using an inversion algorithm to invert the Biot–Savart law. The goal is to obtain the current distribution once the magnetic field is given. However, in order to obtain a stable solution, the magnetic data is severely low-pass filtered in the spatial Fourier domain, and some important information is lost. In this paper, the contribution given by the different spatial frequencies was studied: it was demonstrated how this information can be used to obtain additional information regarding the position of the currents. A comparative study between the theoretical approach and the application to the measurements is also shown. Accepted version 2011-10-12T06:17:17Z 2019-12-06T16:00:49Z 2011-10-12T06:17:17Z 2019-12-06T16:00:49Z 2011 2011 Journal Article Infante, F., Perdu, P., Kor, H. B., Gan, C. L., & Lewis, D. (2011). Magnetic field spatial Fourier analysis: a new opportunity for high resolution current localization. Microelectronics Reliability, 51 (9-11). 0026-2714 https://hdl.handle.net/10356/85280 http://hdl.handle.net/10220/7243 10.1016/j.microrel.2011.07.076 161599 en Microelectronics reliability © 2011 Elsevier.This is the author created version of a work that has been peer reviewed and accepted for publication by Microelectronics Reliability, Elsevier.  It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document.  The published version is available at: http://dx.doi.org/10.1016/j.microrel.2011.07.076. 7 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
spellingShingle DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
Gan, C. L.
Lewis, D.
Infante, F.
Perdu, P.
Kor, H. B.
Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization
description Magnetic microscopy has proven its usefulness throughout the years. It allows current localization with a certain degree of precision by using an inversion algorithm to invert the Biot–Savart law. The goal is to obtain the current distribution once the magnetic field is given. However, in order to obtain a stable solution, the magnetic data is severely low-pass filtered in the spatial Fourier domain, and some important information is lost. In this paper, the contribution given by the different spatial frequencies was studied: it was demonstrated how this information can be used to obtain additional information regarding the position of the currents. A comparative study between the theoretical approach and the application to the measurements is also shown.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Gan, C. L.
Lewis, D.
Infante, F.
Perdu, P.
Kor, H. B.
format Article
author Gan, C. L.
Lewis, D.
Infante, F.
Perdu, P.
Kor, H. B.
author_sort Gan, C. L.
title Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization
title_short Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization
title_full Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization
title_fullStr Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization
title_full_unstemmed Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization
title_sort magnetic field spatial fourier analysis : a new opportunity for high resolution current localization
publishDate 2011
url https://hdl.handle.net/10356/85280
http://hdl.handle.net/10220/7243
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