Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors

In this work, the Electron Backscattered Diffraction technique was employed to obtain the crystallographic orientation distribution, determine the misorientation of grain boundaries and also map the misorientation distribution in Bi-2223 superconductor tapes.

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Bibliographic Details
Main Author: Tan, Thiam Teck.
Other Authors: Li, Sean Suixiang
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/5112
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Institution: Nanyang Technological University