Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors

In this work, the Electron Backscattered Diffraction technique was employed to obtain the crystallographic orientation distribution, determine the misorientation of grain boundaries and also map the misorientation distribution in Bi-2223 superconductor tapes.

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Bibliographic Details
Main Author:	Tan, Thiam Teck.
Other Authors:	Li, Sean Suixiang
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
Online Access:	http://hdl.handle.net/10356/5112
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Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-5112
record_format	dspace
spelling	sg-ntu-dr.10356-51122020-06-01T11:56:49Z Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors Tan, Thiam Teck. Li, Sean Suixiang School of Materials Science & Engineering DRNTU::Engineering::Materials::Microelectronics and semiconductor materials In this work, the Electron Backscattered Diffraction technique was employed to obtain the crystallographic orientation distribution, determine the misorientation of grain boundaries and also map the misorientation distribution in Bi-2223 superconductor tapes. Doctor of Philosophy (SME) 2008-09-17T10:20:17Z 2008-09-17T10:20:17Z 2003 2003 Thesis http://hdl.handle.net/10356/5112 Nanyang Technological University 184 p. application/pdf
institution	Nanyang Technological University
building	NTU Library
country	Singapore
collection	DR-NTU
topic	DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
spellingShingle	DRNTU::Engineering::Materials::Microelectronics and semiconductor materials Tan, Thiam Teck. Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors
description	In this work, the Electron Backscattered Diffraction technique was employed to obtain the crystallographic orientation distribution, determine the misorientation of grain boundaries and also map the misorientation distribution in Bi-2223 superconductor tapes.
author2	Li, Sean Suixiang
author_facet	Li, Sean Suixiang Tan, Thiam Teck.
format	Theses and Dissertations
author	Tan, Thiam Teck.
author_sort	Tan, Thiam Teck.
title	Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors
title_short	Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors
title_full	Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors
title_fullStr	Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors
title_full_unstemmed	Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors
title_sort	effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors
publishDate	2008
url	http://hdl.handle.net/10356/5112
_version_	1681057421534953472

Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors

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