Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization

• Main Authors: Gan, C. L., Lewis, D., Infante, F., Perdu, P., Kor, H. B.
• 其他作者: School of Materials Science & Engineering
• 格式: Article
• 語言: English
• 出版: 2011
• 主題: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
• 在線閱讀: https://hdl.handle.net/10356/85280; http://hdl.handle.net/10220/7243

Magnetic microscopy has proven its usefulness throughout the years. It allows current localization with a certain degree of precision by using an inversion algorithm to invert the Biot–Savart law. The goal is to obtain the current distribution once the magnetic field is given. However, in order to o...