Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization

• المؤلفون الرئيسيون: Gan, C. L., Lewis, D., Infante, F., Perdu, P., Kor, H. B.
• مؤلفون آخرون: School of Materials Science & Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2011
• الموضوعات: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/85280; http://hdl.handle.net/10220/7243

Magnetic microscopy has proven its usefulness throughout the years. It allows current localization with a certain degree of precision by using an inversion algorithm to invert the Biot–Savart law. The goal is to obtain the current distribution once the magnetic field is given. However, in order to o...