An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector

Fault injection attack against embedded devices has attracted much attention in recent years. As a highly efficient fault injection, EM fault injection (EMFI) outperforms other injection means owing to its outstanding penetration capability in incurring local faults into security ICs. In this paper,...

Full description

Saved in:
Bibliographic Details
Main Authors: Breier, Jakub, Bhasin, Shivam, He, Wei
Other Authors: 2017 18th International Symposium on Quality Electronic Design (ISQED)
Format: Conference or Workshop Item
Language:English
Published: 2018
Subjects:
Online Access:https://hdl.handle.net/10356/88795
http://hdl.handle.net/10220/44742
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English
Description
Summary:Fault injection attack against embedded devices has attracted much attention in recent years. As a highly efficient fault injection, EM fault injection (EMFI) outperforms other injection means owing to its outstanding penetration capability in incurring local faults into security ICs. In this paper, we present an all digital countermeasure for detecting the on-the-fly EMFI attempts in silicon chips. The proposed logic consists of a watchdog ring-oscillator (RO), and a Hogge Phase Detector (PD) for sensing the frequency turbulence induced by the ongoing EMFIs. Experimental validation on Xilinx FPGA Virtex-5 FPGA reports a fault detection rate of 93.15% and a failure rate of 0.0069, with negligible overhead. A significant security margin for alerting the injection attempt is also noticeable. The technique is versatile and can be integrated in any VLSI design for its lightweight and all digital architecture, especially for the security-critical scenarios, such as the endpoints of Internet-of-Things (IoT).