An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector

• Main Authors: Breier, Jakub, Bhasin, Shivam, He, Wei
• Other Authors: 2017 18th International Symposium on Quality Electronic Design (ISQED)
• Format: Conference or Workshop Item
• Language: English
• Published: 2018
• Subjects: Fault Injection Attack; Hooge Phase Detector
• Online Access: https://hdl.handle.net/10356/88795; http://hdl.handle.net/10220/44742
• Institution: Nanyang Technological University

Fault injection attack against embedded devices has attracted much attention in recent years. As a highly efficient fault injection, EM fault injection (EMFI) outperforms other injection means owing to its outstanding penetration capability in incurring local faults into security ICs. In this paper,...