An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector

Fault injection attack against embedded devices has attracted much attention in recent years. As a highly efficient fault injection, EM fault injection (EMFI) outperforms other injection means owing to its outstanding penetration capability in incurring local faults into security ICs. In this paper,...

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Main Authors: Breier, Jakub, Bhasin, Shivam, He, Wei
Other Authors: 2017 18th International Symposium on Quality Electronic Design (ISQED)
Format: Conference or Workshop Item
Language:English
Published: 2018
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Online Access:https://hdl.handle.net/10356/88795
http://hdl.handle.net/10220/44742
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-887952020-09-26T22:15:44Z An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector Breier, Jakub Bhasin, Shivam He, Wei 2017 18th International Symposium on Quality Electronic Design (ISQED) Temasek Laboratories Fault Injection Attack Hooge Phase Detector Fault injection attack against embedded devices has attracted much attention in recent years. As a highly efficient fault injection, EM fault injection (EMFI) outperforms other injection means owing to its outstanding penetration capability in incurring local faults into security ICs. In this paper, we present an all digital countermeasure for detecting the on-the-fly EMFI attempts in silicon chips. The proposed logic consists of a watchdog ring-oscillator (RO), and a Hogge Phase Detector (PD) for sensing the frequency turbulence induced by the ongoing EMFIs. Experimental validation on Xilinx FPGA Virtex-5 FPGA reports a fault detection rate of 93.15% and a failure rate of 0.0069, with negligible overhead. A significant security margin for alerting the injection attempt is also noticeable. The technique is versatile and can be integrated in any VLSI design for its lightweight and all digital architecture, especially for the security-critical scenarios, such as the endpoints of Internet-of-Things (IoT). Accepted version 2018-05-03T05:15:15Z 2019-12-06T17:11:02Z 2018-05-03T05:15:15Z 2019-12-06T17:11:02Z 2017-05-01 2017 Conference Paper Breier, J., Bhasin, S., & He, W. (2017). An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector. 2017 18th International Symposium on Quality Electronic Design (ISQED), 307-312. https://hdl.handle.net/10356/88795 http://hdl.handle.net/10220/44742 10.1109/ISQED.2017.7918333 206827 en © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/ISQED.2017.7918333]. 6 p. application/pdf
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic Fault Injection Attack
Hooge Phase Detector
spellingShingle Fault Injection Attack
Hooge Phase Detector
Breier, Jakub
Bhasin, Shivam
He, Wei
An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector
description Fault injection attack against embedded devices has attracted much attention in recent years. As a highly efficient fault injection, EM fault injection (EMFI) outperforms other injection means owing to its outstanding penetration capability in incurring local faults into security ICs. In this paper, we present an all digital countermeasure for detecting the on-the-fly EMFI attempts in silicon chips. The proposed logic consists of a watchdog ring-oscillator (RO), and a Hogge Phase Detector (PD) for sensing the frequency turbulence induced by the ongoing EMFIs. Experimental validation on Xilinx FPGA Virtex-5 FPGA reports a fault detection rate of 93.15% and a failure rate of 0.0069, with negligible overhead. A significant security margin for alerting the injection attempt is also noticeable. The technique is versatile and can be integrated in any VLSI design for its lightweight and all digital architecture, especially for the security-critical scenarios, such as the endpoints of Internet-of-Things (IoT).
author2 2017 18th International Symposium on Quality Electronic Design (ISQED)
author_facet 2017 18th International Symposium on Quality Electronic Design (ISQED)
Breier, Jakub
Bhasin, Shivam
He, Wei
format Conference or Workshop Item
author Breier, Jakub
Bhasin, Shivam
He, Wei
author_sort Breier, Jakub
title An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector
title_short An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector
title_full An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector
title_fullStr An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector
title_full_unstemmed An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector
title_sort electromagnetic fault injection sensor using hogge phase-detector
publishDate 2018
url https://hdl.handle.net/10356/88795
http://hdl.handle.net/10220/44742
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