A non-contact measuring system for in-situ surface characterization based on laser confocal microscopy

The characterization of surface topographic features on a component is typically quantified using two-dimensional roughness descriptors which are captured by off-line desktop instruments. Ideally any measurement system should be integrated into the manufacturing process to provide in-situ measuremen...

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Bibliographic Details
Main Authors: Fu, Shaowei, Cheng, Fang, Tjahjowidodo, Tegoeh, Zhou, Yu, Butler, David
Other Authors: School of Mechanical and Aerospace Engineering
Format: Article
Language:English
Published: 2018
Subjects:
Online Access:https://hdl.handle.net/10356/88968
http://hdl.handle.net/10220/46015
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Institution: Nanyang Technological University
Language: English
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