A non-contact measuring system for in-situ surface characterization based on laser confocal microscopy
The characterization of surface topographic features on a component is typically quantified using two-dimensional roughness descriptors which are captured by off-line desktop instruments. Ideally any measurement system should be integrated into the manufacturing process to provide in-situ measuremen...
Saved in:
Main Authors: | Fu, Shaowei, Cheng, Fang, Tjahjowidodo, Tegoeh, Zhou, Yu, Butler, David |
---|---|
Other Authors: | School of Mechanical and Aerospace Engineering |
Format: | Article |
Language: | English |
Published: |
2018
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/88968 http://hdl.handle.net/10220/46015 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Laser integrated measurement of surface roughness and micro-displacement
by: Wang, S.H., et al.
Published: (2014) -
In situ surface roughness measurement using a laser scattering method
by: Tay, C.J., et al.
Published: (2014) -
Surface roughness measurement of semi-conductor wafers using a modified total integrated scattering model
by: Tay, C.J., et al.
Published: (2014) -
DEVELOPMENT OF NON-CONTACT MICROSPHERE CONFOCAL SCANNING MICROSCOPE
by: YANG XILIANG
Published: (2021) -
Whole field surface roughness measurement by laser speckle correlation technique
by: Toh, S.L., et al.
Published: (2014)