A non-contact measuring system for in-situ surface characterization based on laser confocal microscopy
The characterization of surface topographic features on a component is typically quantified using two-dimensional roughness descriptors which are captured by off-line desktop instruments. Ideally any measurement system should be integrated into the manufacturing process to provide in-situ measuremen...
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Main Authors: | , , , , |
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格式: | Article |
語言: | English |
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2018
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在線閱讀: | https://hdl.handle.net/10356/88968 http://hdl.handle.net/10220/46015 |
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機構: | Nanyang Technological University |
語言: | English |