A non-contact measuring system for in-situ surface characterization based on laser confocal microscopy

The characterization of surface topographic features on a component is typically quantified using two-dimensional roughness descriptors which are captured by off-line desktop instruments. Ideally any measurement system should be integrated into the manufacturing process to provide in-situ measuremen...

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Main Authors: Fu, Shaowei, Cheng, Fang, Tjahjowidodo, Tegoeh, Zhou, Yu, Butler, David
其他作者: School of Mechanical and Aerospace Engineering
格式: Article
語言:English
出版: 2018
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在線閱讀:https://hdl.handle.net/10356/88968
http://hdl.handle.net/10220/46015
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機構: Nanyang Technological University
語言: English