Speckle referencing: digital speckle pattern interferometry (SR- DSPI) for imaging of non-diffusive surfaces

• المؤلفون الرئيسيون: Matham, Murukeshan Vadakke, Chan, Kelvin H. K., Song, Chaolong
• مؤلفون آخرون: Asundi, Anand K.
• التنسيق: Conference or Workshop Item
• اللغة: English
• منشور في: 2018
• الموضوعات: Laser Speckle; DRNTU::Engineering::Mechanical engineering; Non-diffusive Surface
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/89491; http://hdl.handle.net/10220/47089
• المؤسسة: Nanyang Technological University

Optical metrology has been widely employed as a key technique for modern industrial production, owing to its fast, precise and non-invasive measurement. Digital speckle pattern interferometry (DSPI) is one of these non-destructive testing methods that possess the abilities to measure surface deforma...