Pulsed laser scan methodology for single event effect (SEE) qualification
This thesis addresses the need for alternative methods of single event effect (SEE) radiation testing in a period when microelectronic technology nodes are scaling to ever smaller dimensions. This results in increasingly complex devices and compels radiation test engineers to demand radiation test t...
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格式: | Theses and Dissertations |
語言: | English |
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2019
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在線閱讀: | https://hdl.handle.net/10356/89873 http://hdl.handle.net/10220/47728 |
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