Pulsed laser scan methodology for single event effect (SEE) qualification

This thesis addresses the need for alternative methods of single event effect (SEE) radiation testing in a period when microelectronic technology nodes are scaling to ever smaller dimensions. This results in increasingly complex devices and compels radiation test engineers to demand radiation test t...

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書目詳細資料
主要作者: Chua, Chung Tah
其他作者: Gan Chee Lip
格式: Theses and Dissertations
語言:English
出版: 2019
主題:
在線閱讀:https://hdl.handle.net/10356/89873
http://hdl.handle.net/10220/47728
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