Pulsed laser scan methodology for single event effect (SEE) qualification

• Main Author: Chua, Chung Tah
• Other Authors: Gan Chee Lip
• Format: Theses and Dissertations
• Language: English
• Published: 2019
• Subjects: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials; DRNTU::Science::Physics::Radiation physics
• Online Access: https://hdl.handle.net/10356/89873; http://hdl.handle.net/10220/47728
• Institution: Nanyang Technological University

This thesis addresses the need for alternative methods of single event effect (SEE) radiation testing in a period when microelectronic technology nodes are scaling to ever smaller dimensions. This results in increasingly complex devices and compels radiation test engineers to demand radiation test t...