Pulsed laser scan methodology for single event effect (SEE) qualification

• المؤلف الرئيسي: Chua, Chung Tah
• مؤلفون آخرون: Gan Chee Lip
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2019
• الموضوعات: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials; DRNTU::Science::Physics::Radiation physics
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/89873; http://hdl.handle.net/10220/47728

This thesis addresses the need for alternative methods of single event effect (SEE) radiation testing in a period when microelectronic technology nodes are scaling to ever smaller dimensions. This results in increasingly complex devices and compels radiation test engineers to demand radiation test t...