Methods for resolving the challenges of degradation diagnosis for SiC power MOSFET

Modern society is in quest of more electric power in various sectors. The rising power demand has driven the development trend of power electronic converters toward higher power density. Power electronic converters, however, are subject to continuous electrical and thermal strains that threaten thei...

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Bibliographic Details
Main Author: Yang, Hui-Chen
Other Authors: See Kye Yak
Format: Theses and Dissertations
Language:English
Published: 2019
Subjects:
Online Access:https://hdl.handle.net/10356/90291
http://hdl.handle.net/10220/48539
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Institution: Nanyang Technological University
Language: English

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