Methods for resolving the challenges of degradation diagnosis for SiC power MOSFET
Modern society is in quest of more electric power in various sectors. The rising power demand has driven the development trend of power electronic converters toward higher power density. Power electronic converters, however, are subject to continuous electrical and thermal strains that threaten thei...
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Main Author: | Yang, Hui-Chen |
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Other Authors: | See Kye Yak |
Format: | Theses and Dissertations |
Language: | English |
Published: |
2019
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/90291 http://hdl.handle.net/10220/48539 |
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Institution: | Nanyang Technological University |
Language: | English |
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