Nanoscale polarization relaxation of epitaxial BiFeO3 thin film

The polarization relaxation phenomena in a 40-nm-thick epitaxial BiFeO3 thin film grown on a (001) SrTiO3 substrate with SrRuO3 bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The as-grown film shows highly irregular mosaic domain pa...

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Main Authors: Chen, Weigang, You, Lu, Chen, Gaofeng, Chua, Ngeah Theng, Guan, Ong Hock, Zou, Xi, Wang, Junling, Chen, Lang
其他作者: School of Materials Science & Engineering
格式: Article
語言:English
出版: 2011
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在線閱讀:https://hdl.handle.net/10356/90597
http://hdl.handle.net/10220/7400
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