Determination of diffusion length from within a confined region with the use of EBIC

A new method of extracting minority carrier diffusion length from within a confined region of material is presented in this paper. This technique uses the finite difference method and can be used on samples where the diffusion lengths are longer than the width of the region. This cannot be achieved...

Full description

Saved in:

Bibliographic Details
Main Authors:	Ong, Vincent K. S., Wu, Dethau.
Other Authors:	School of Electrical and Electronic Engineering
Format:	Article
Language:	English
Published:	2009
Subjects:	DRNTU::Engineering::Electrical and electronic engineering
Online Access:	https://hdl.handle.net/10356/91351 http://hdl.handle.net/10220/5991
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	Nanyang Technological University
Language:	English

id	sg-ntu-dr.10356-91351
record_format	dspace
spelling	sg-ntu-dr.10356-913512020-03-07T14:02:39Z Determination of diffusion length from within a confined region with the use of EBIC Ong, Vincent K. S. Wu, Dethau. School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering A new method of extracting minority carrier diffusion length from within a confined region of material is presented in this paper. This technique uses the finite difference method and can be used on samples where the diffusion lengths are longer than the width of the region. This cannot be achieved using the conventional method, which evaluates the negative reciprocal of the slope of the EBIC signals line scan plotted on a semi-logarithmic scale. A limitation of this method is that the beam entrance surface of the sample is assumed to have negligible surface recombination. Published version 2009-08-03T01:48:11Z 2019-12-06T18:04:07Z 2009-08-03T01:48:11Z 2019-12-06T18:04:07Z 2001 2001 Journal Article Ong, V. K. S., & Wu, D. (2001). Determination of diffusion length from within a confined region with the use of EBIC. IEEE Transactions on Electron Devices, 48(2), 332-337. 0018-9383 https://hdl.handle.net/10356/91351 http://hdl.handle.net/10220/5991 10.1109/16.902735 en IEEE transactions on electron devices IEEE Transactions on Electron Devices © 2001 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site. 6 p. application/pdf
institution	Nanyang Technological University
building	NTU Library
country	Singapore
collection	DR-NTU
language	English
topic	DRNTU::Engineering::Electrical and electronic engineering
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering Ong, Vincent K. S. Wu, Dethau. Determination of diffusion length from within a confined region with the use of EBIC
description	A new method of extracting minority carrier diffusion length from within a confined region of material is presented in this paper. This technique uses the finite difference method and can be used on samples where the diffusion lengths are longer than the width of the region. This cannot be achieved using the conventional method, which evaluates the negative reciprocal of the slope of the EBIC signals line scan plotted on a semi-logarithmic scale. A limitation of this method is that the beam entrance surface of the sample is assumed to have negligible surface recombination.
author2	School of Electrical and Electronic Engineering
author_facet	School of Electrical and Electronic Engineering Ong, Vincent K. S. Wu, Dethau.
format	Article
author	Ong, Vincent K. S. Wu, Dethau.
author_sort	Ong, Vincent K. S.
title	Determination of diffusion length from within a confined region with the use of EBIC
title_short	Determination of diffusion length from within a confined region with the use of EBIC
title_full	Determination of diffusion length from within a confined region with the use of EBIC
title_fullStr	Determination of diffusion length from within a confined region with the use of EBIC
title_full_unstemmed	Determination of diffusion length from within a confined region with the use of EBIC
title_sort	determination of diffusion length from within a confined region with the use of ebic
publishDate	2009
url	https://hdl.handle.net/10356/91351 http://hdl.handle.net/10220/5991
_version_	1681049176459182080

Determination of diffusion length from within a confined region with the use of EBIC

Similar Items