Determination of diffusion length from within a confined region with the use of EBIC

• Main Authors: Ong, Vincent K. S., Wu, Dethau.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2009
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/91351; http://hdl.handle.net/10220/5991
• Institution: Nanyang Technological University

A new method of extracting minority carrier diffusion length from within a confined region of material is presented in this paper. This technique uses the finite difference method and can be used on samples where the diffusion lengths are longer than the width of the region. This cannot be achieved...