Temporal wavelet analysis for deformation measurement of small components using micro-ESPI
Measuring continuous deformation of specimens whose dimensions are in the range of sub-millimeter introduces a number of difficulties using laser speckle interferometry. During deformation, the speckle patterns recorded on a camera sensor change constantly. These time-dependent speckle patterns woul...
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| Main Authors: | , , , |
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| 格式: | Conference or Workshop Item |
| 語言: | English |
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2010
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| 主題: | |
| 在線閱讀: | https://hdl.handle.net/10356/91917 http://hdl.handle.net/10220/6476 |
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| 機構: | Nanyang Technological University |
| 語言: | English |