Charge collection from within a collecting junction well

• المؤلفون الرئيسيون: Kurniawan, Oka., Ong, Vincent K. S.
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2010
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/92634; http://hdl.handle.net/10220/6270
• المؤسسة: Nanyang Technological University

This paper provides the analytical equation for the charge collection from a collecting region with a finite dimension. Electron-beam-induced current has widely been used for semiconductor characterization. The availability of analytical expressions would further enhance the study and development of...