Charge collection from within a collecting junction well

This paper provides the analytical equation for the charge collection from a collecting region with a finite dimension. Electron-beam-induced current has widely been used for semiconductor characterization. The availability of analytical expressions would further enhance the study and development of...

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Bibliographic Details
Main Authors: Kurniawan, Oka., Ong, Vincent K. S.
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2010
Subjects:
Online Access:https://hdl.handle.net/10356/92634
http://hdl.handle.net/10220/6270
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Institution: Nanyang Technological University
Language: English

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