$X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials$

X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials

Abstract not available.

Saved in:

Bibliographic Details
Main Author:	Dong, Zhili
Other Authors:	School of Materials Science & Engineering
Format:	Article
Language:	English
Published:	2013
Online Access:	https://hdl.handle.net/10356/93970 http://hdl.handle.net/10220/9215
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	Nanyang Technological University
Language:	English

Description
Summary:	Abstract not available.

Similar Items