X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials
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sg-ntu-dr.10356-939702020-06-01T10:26:49Z X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials Dong, Zhili School of Materials Science & Engineering Abstract not available. 2013-02-21T07:08:57Z 2019-12-06T18:48:37Z 2013-02-21T07:08:57Z 2019-12-06T18:48:37Z 2009 2009 Journal Article Dong, Z. L. (2009). X-ray diffraction, Rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials. Handbook of Nanoceramics and Their Based Nanodevices (pp. 303-336). USA: American Scientific Publishers. https://hdl.handle.net/10356/93970 http://hdl.handle.net/10220/9215 en Handbook of nanoceramics and their based nanodevices © 2009 American Scientific Publishers. |
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English |
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Abstract not available. |
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School of Materials Science & Engineering |
| author_facet |
School of Materials Science & Engineering Dong, Zhili |
| format |
Article |
| author |
Dong, Zhili |
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Dong, Zhili X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
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Dong, Zhili |
| title |
X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| title_short |
X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| title_full |
X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| title_fullStr |
X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| title_full_unstemmed |
X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| title_sort |
x-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| publishDate |
2013 |
| url |
https://hdl.handle.net/10356/93970 http://hdl.handle.net/10220/9215 |
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1681058679969808384 |