X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials
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Format: | Article |
Language: | English |
Published: |
2013
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Online Access: | https://hdl.handle.net/10356/93970 http://hdl.handle.net/10220/9215 |
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Institution: | Nanyang Technological University |
Language: | English |
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