Effect of plating parameters on the intrinsic stress in electroless nickel plating

With the increasing application of electroless nickel (EN) as a bumping or under-bumping metalization material, the microelectronic packaging engineers are required to have a deeper understanding and control of intrinsic stress in EN plating. The purpose of this work is to investigate the effect of...

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Main Authors: Chen, Zhong, Xu, Xiaoda, Wong, Chee C., Mhaisalkar, Subodh Gautam
其他作者: School of Materials Science & Engineering
格式: Article
語言:English
出版: 2012
主題:
在線閱讀:https://hdl.handle.net/10356/94041
http://hdl.handle.net/10220/8175
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機構: Nanyang Technological University
語言: English