Digital in-line holography for dynamic micro-metrology
In this paper in-line digital holography has been explored for dynamic micro metrological applications. In in-line digital holography, full CCD sensor area is utilized for real image reconstruction of the objects with less speckle noise. Numerical evaluation of the amplitude and phase information du...
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Main Authors: | Hegde, Gopalkrishna M., Singh, Vijay Raj, Asundi, Anand Krishna |
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Other Authors: | School of Mechanical and Aerospace Engineering |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2011
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/94256 http://hdl.handle.net/10220/7189 |
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Institution: | Nanyang Technological University |
Language: | English |
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