Digital in-line holography for dynamic micro-metrology

In this paper in-line digital holography has been explored for dynamic micro metrological applications. In in-line digital holography, full CCD sensor area is utilized for real image reconstruction of the objects with less speckle noise. Numerical evaluation of the amplitude and phase information du...

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Bibliographic Details
Main Authors: Hegde, Gopalkrishna M., Singh, Vijay Raj, Asundi, Anand Krishna
Other Authors: School of Mechanical and Aerospace Engineering
Format: Conference or Workshop Item
Language:English
Published: 2011
Subjects:
Online Access:https://hdl.handle.net/10356/94256
http://hdl.handle.net/10220/7189
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Institution: Nanyang Technological University
Language: English

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