Measurement of buried undercut structures in microfluidic devices by laser fluorescent confocal microscopy
Measuring buried, undercut microstructures is a challenging task in metrology. These structures are usually characterized by measuring their cross sections after physically cutting the samples. This method is destructive and the obtained information is incomplete. The distortion due to cutting also...
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| Main Authors: | , , , , |
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| 格式: | Article |
| 語言: | English |
| 出版: |
2012
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| 主題: | |
| 在線閱讀: | https://hdl.handle.net/10356/94260 http://hdl.handle.net/10220/7879 |
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| 機構: | Nanyang Technological University |
| 語言: | English |