Fracture of Sn-Ag-Cu solder joints on Cu substrates : I. effects of loading and processing conditions

During service, microcracks form inside solder joints, making microelectronic packages highly prone to failure on dropping. Hence, the fracture behavior of solder joints under drop conditions at high strain rates and under mixed-mode conditions is a critically important design consideration for robu...

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Main Authors: Pang, John Hock Lye, Huang, Z., Kumar, P., Dutta, I., Sidhu, R., Renavikar, M., Mahajan, R.
Other Authors: School of Mechanical and Aerospace Engineering
Format: Article
Language:English
Published: 2013
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Online Access:https://hdl.handle.net/10356/96082
http://hdl.handle.net/10220/18099
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-960822020-03-07T13:19:23Z Fracture of Sn-Ag-Cu solder joints on Cu substrates : I. effects of loading and processing conditions Pang, John Hock Lye Huang, Z. Kumar, P. Dutta, I. Sidhu, R. Renavikar, M. Mahajan, R. School of Mechanical and Aerospace Engineering DRNTU::Engineering::Materials::Electronic packaging materials During service, microcracks form inside solder joints, making microelectronic packages highly prone to failure on dropping. Hence, the fracture behavior of solder joints under drop conditions at high strain rates and under mixed-mode conditions is a critically important design consideration for robust joints. This study reports on the effects of joint processing and loading conditions on the microstructure and fracture response of Sn-3.8%Ag-0.7%Cu (SAC387) solder joints attached to Cu substrates. The impact of parameters which control the microstructure (reflow condition, aging) as well as loading conditions (strain rate and loading angle) are explicitly studied. A methodology based on the calculation of the critical energy release rate, G C, using compact mixed-mode (CMM) samples was developed to quantify the fracture toughness of the joints under conditions of adhesive (i.e., interface-related) fracture. In general, higher strain rate and increased mode-mixity resulted in decreased G C. G C also decreased with increasing dwell time at reflow temperature, which produced a thicker intermetallic layer at the solder–substrate interface. Softer solders, produced by slower cooling following reflow, or post-reflow aging, showed enhanced G C. The sensitivity of the fracture toughness to all of the aforementioned parameters reduced with an increase in the mode-mixity. Fracture mechanisms, elucidating the effects of the loading conditions and process parameters, are briefly highlighted. 2013-12-05T04:39:13Z 2019-12-06T19:25:20Z 2013-12-05T04:39:13Z 2019-12-06T19:25:20Z 2012 2012 Journal Article Huang, Z., Kumar, P., Dutta, I., Pang, J. H. L., Sidhu, R., Renavikar, M., et al. (2012). Fracture of Sn-Ag-Cu solder joints on Cu substrates : I. effects of loading and processing conditions. Journal of electronic materials, 41(2), 375-389. https://hdl.handle.net/10356/96082 http://hdl.handle.net/10220/18099 10.1007/s11664-011-1769-8 en Journal of electronic materials
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic DRNTU::Engineering::Materials::Electronic packaging materials
spellingShingle DRNTU::Engineering::Materials::Electronic packaging materials
Pang, John Hock Lye
Huang, Z.
Kumar, P.
Dutta, I.
Sidhu, R.
Renavikar, M.
Mahajan, R.
Fracture of Sn-Ag-Cu solder joints on Cu substrates : I. effects of loading and processing conditions
description During service, microcracks form inside solder joints, making microelectronic packages highly prone to failure on dropping. Hence, the fracture behavior of solder joints under drop conditions at high strain rates and under mixed-mode conditions is a critically important design consideration for robust joints. This study reports on the effects of joint processing and loading conditions on the microstructure and fracture response of Sn-3.8%Ag-0.7%Cu (SAC387) solder joints attached to Cu substrates. The impact of parameters which control the microstructure (reflow condition, aging) as well as loading conditions (strain rate and loading angle) are explicitly studied. A methodology based on the calculation of the critical energy release rate, G C, using compact mixed-mode (CMM) samples was developed to quantify the fracture toughness of the joints under conditions of adhesive (i.e., interface-related) fracture. In general, higher strain rate and increased mode-mixity resulted in decreased G C. G C also decreased with increasing dwell time at reflow temperature, which produced a thicker intermetallic layer at the solder–substrate interface. Softer solders, produced by slower cooling following reflow, or post-reflow aging, showed enhanced G C. The sensitivity of the fracture toughness to all of the aforementioned parameters reduced with an increase in the mode-mixity. Fracture mechanisms, elucidating the effects of the loading conditions and process parameters, are briefly highlighted.
author2 School of Mechanical and Aerospace Engineering
author_facet School of Mechanical and Aerospace Engineering
Pang, John Hock Lye
Huang, Z.
Kumar, P.
Dutta, I.
Sidhu, R.
Renavikar, M.
Mahajan, R.
format Article
author Pang, John Hock Lye
Huang, Z.
Kumar, P.
Dutta, I.
Sidhu, R.
Renavikar, M.
Mahajan, R.
author_sort Pang, John Hock Lye
title Fracture of Sn-Ag-Cu solder joints on Cu substrates : I. effects of loading and processing conditions
title_short Fracture of Sn-Ag-Cu solder joints on Cu substrates : I. effects of loading and processing conditions
title_full Fracture of Sn-Ag-Cu solder joints on Cu substrates : I. effects of loading and processing conditions
title_fullStr Fracture of Sn-Ag-Cu solder joints on Cu substrates : I. effects of loading and processing conditions
title_full_unstemmed Fracture of Sn-Ag-Cu solder joints on Cu substrates : I. effects of loading and processing conditions
title_sort fracture of sn-ag-cu solder joints on cu substrates : i. effects of loading and processing conditions
publishDate 2013
url https://hdl.handle.net/10356/96082
http://hdl.handle.net/10220/18099
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