Cu–Cu hermetic seal enhancement using self-assembled monolayer passivation

• المؤلفون الرئيسيون: Peng, L., Leong, K. C., Lim, Dau Fatt, Fan, Ji, Tan, Chuan Seng
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2013
• الموضوعات: DRNTU::Engineering::Materials::Electronic packaging materials
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/96183; http://hdl.handle.net/10220/18163
• المؤسسة: Nanyang Technological University

Low-temperature Cu–Cu thermocompression bonding enabled by self-assembled monolayer (SAM) passivation for hermetic sealing application is investigated in this work. Cavities are etched to a volume of 1.4 × 10−3 cm3 in accordance with the MIL-STD-883E standard prescribed for microelectronics packagin...