Reconfiguration algorithms for degradable VLSI arrays with switch faults

The problem of reconfiguring two-dimensional VLSI arrays with faults is to find a maximum logical array without faults. The existing algorithms only consider faults associated with processing elements, and all switches and links are assumed to be fault-free. But switch faults may often occur in the...

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Bibliographic Details
Main Authors: Zhu, Yuanbo, Wu, Jigang, Lam, Siew-Kei, Srikanthan, Thambipillai
Other Authors: School of Computer Engineering
Format: Conference or Workshop Item
Language:English
Published: 2013
Subjects:
Online Access:https://hdl.handle.net/10356/98212
http://hdl.handle.net/10220/12425
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Institution: Nanyang Technological University
Language: English