Reconfiguration algorithms for degradable VLSI arrays with switch faults

The problem of reconfiguring two-dimensional VLSI arrays with faults is to find a maximum logical array without faults. The existing algorithms only consider faults associated with processing elements, and all switches and links are assumed to be fault-free. But switch faults may often occur in the...

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Main Authors: Zhu, Yuanbo, Wu, Jigang, Lam, Siew-Kei, Srikanthan, Thambipillai
其他作者: School of Computer Engineering
格式: Conference or Workshop Item
語言:English
出版: 2013
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在線閱讀:https://hdl.handle.net/10356/98212
http://hdl.handle.net/10220/12425
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機構: Nanyang Technological University
語言: English

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