Reconfiguration algorithms for degradable VLSI arrays with switch faults
The problem of reconfiguring two-dimensional VLSI arrays with faults is to find a maximum logical array without faults. The existing algorithms only consider faults associated with processing elements, and all switches and links are assumed to be fault-free. But switch faults may often occur in the...
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Main Authors: | Zhu, Yuanbo, Wu, Jigang, Lam, Siew-Kei, Srikanthan, Thambipillai |
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其他作者: | School of Computer Engineering |
格式: | Conference or Workshop Item |
語言: | English |
出版: |
2013
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主題: | |
在線閱讀: | https://hdl.handle.net/10356/98212 http://hdl.handle.net/10220/12425 |
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機構: | Nanyang Technological University |
語言: | English |
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