Reconfiguration algorithms for degradable VLSI arrays with switch faults
The problem of reconfiguring two-dimensional VLSI arrays with faults is to find a maximum logical array without faults. The existing algorithms only consider faults associated with processing elements, and all switches and links are assumed to be fault-free. But switch faults may often occur in the...
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Main Authors: | , , , |
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Other Authors: | |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2013
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/98212 http://hdl.handle.net/10220/12425 |
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Institution: | Nanyang Technological University |
Language: | English |
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