Maximization of SRAM energy efficiency utilizing MTCMOS technology

Higher-Vth devices in the cross-coupled latches and the write access transistors, and lower-Vth devices in the read ports are preferred for reducing leakage current without sacrificing performance. However, at ultra-low supply voltage levels, higher-Vth devices can retard or nullify energy efficienc...

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Bibliographic Details
Main Authors: Wang, Bo, Zhou, Jun, Kim, Tony Tae-Hyoung
Other Authors: School of Electrical and Electronic Engineering
Format: Conference or Workshop Item
Language:English
Published: 2013
Subjects:
Online Access:https://hdl.handle.net/10356/99114
http://hdl.handle.net/10220/12584
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Institution: Nanyang Technological University
Language: English