Correlation between intermetallic thickness and roughness during solder reflow

10.1007/BF02657724

Saved in:
Bibliographic Details
Main Authors: Zuruzi, A.S., Lahiri, S.K., Burman, P., Siow, K.S.
Other Authors: STATISTICS & APPLIED PROBABILITY
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/105075
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore