Correlation between intermetallic thickness and roughness during solder reflow
10.1007/BF02657724
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Main Authors: | Zuruzi, A.S., Lahiri, S.K., Burman, P., Siow, K.S. |
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Other Authors: | STATISTICS & APPLIED PROBABILITY |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/105075 |
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Institution: | National University of Singapore |
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