Depth profile study of the structure and strain distribution in chemically grown Cu films on AlN

10.1016/S0965-9773(99)00209-3

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Bibliographic Details
Main Authors: Martínez-Miranda, L.J., Li, Y., Chow, G.M., Kurihara, L.K.
Other Authors: MATERIALS SCIENCE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/106997
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Institution: National University of Singapore