Fracture analysis of silicon die and ceramic package using fractography

International Journal of Microcircuits and Electronic Packaging

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Bibliographic Details
Main Author: Marks, Michael Raj
Other Authors: INSTITUTE OF MICROELECTRONICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/112968
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Institution: National University of Singapore
Description
Summary:International Journal of Microcircuits and Electronic Packaging