High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films

10.1016/j.surfcoat.2004.10.114

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Main Authors: Yang, P., Lu, D., Murthy, B.R., Moser, H.O.
Other Authors: SINGAPORE SYNCHROTRON LIGHT SOURCE
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/113020
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1130202023-10-25T07:41:01Z High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films Yang, P. Lu, D. Murthy, B.R. Moser, H.O. SINGAPORE SYNCHROTRON LIGHT SOURCE [B]Atomic force microscopy (AFM) [B]interferometry [B]roughness [X]X-ray reflectivity 10.1016/j.surfcoat.2004.10.114 Surface and Coatings Technology 198 1-3 SPEC. ISS. 133-137 2014-11-28T08:43:19Z 2014-11-28T08:43:19Z 2005-08-01 Article Yang, P., Lu, D., Murthy, B.R., Moser, H.O. (2005-08-01). High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films. Surface and Coatings Technology 198 (1-3 SPEC. ISS.) : 133-137. ScholarBank@NUS Repository. https://doi.org/10.1016/j.surfcoat.2004.10.114 02578972 http://scholarbank.nus.edu.sg/handle/10635/113020 000230419400027 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic [B]Atomic force microscopy (AFM)
[B]interferometry
[B]roughness
[X]X-ray reflectivity
spellingShingle [B]Atomic force microscopy (AFM)
[B]interferometry
[B]roughness
[X]X-ray reflectivity
Yang, P.
Lu, D.
Murthy, B.R.
Moser, H.O.
High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films
description 10.1016/j.surfcoat.2004.10.114
author2 SINGAPORE SYNCHROTRON LIGHT SOURCE
author_facet SINGAPORE SYNCHROTRON LIGHT SOURCE
Yang, P.
Lu, D.
Murthy, B.R.
Moser, H.O.
format Article
author Yang, P.
Lu, D.
Murthy, B.R.
Moser, H.O.
author_sort Yang, P.
title High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films
title_short High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films
title_full High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films
title_fullStr High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films
title_full_unstemmed High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films
title_sort high-resolution synchrotron x-ray reflectivity study of the density of plasma-treated ultra low-k films
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/113020
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