High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films
10.1016/j.surfcoat.2004.10.114
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sg-nus-scholar.10635-1130202023-10-25T07:41:01Z High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films Yang, P. Lu, D. Murthy, B.R. Moser, H.O. SINGAPORE SYNCHROTRON LIGHT SOURCE [B]Atomic force microscopy (AFM) [B]interferometry [B]roughness [X]X-ray reflectivity 10.1016/j.surfcoat.2004.10.114 Surface and Coatings Technology 198 1-3 SPEC. ISS. 133-137 2014-11-28T08:43:19Z 2014-11-28T08:43:19Z 2005-08-01 Article Yang, P., Lu, D., Murthy, B.R., Moser, H.O. (2005-08-01). High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films. Surface and Coatings Technology 198 (1-3 SPEC. ISS.) : 133-137. ScholarBank@NUS Repository. https://doi.org/10.1016/j.surfcoat.2004.10.114 02578972 http://scholarbank.nus.edu.sg/handle/10635/113020 000230419400027 Scopus |
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[B]Atomic force microscopy (AFM) [B]interferometry [B]roughness [X]X-ray reflectivity |
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[B]Atomic force microscopy (AFM) [B]interferometry [B]roughness [X]X-ray reflectivity Yang, P. Lu, D. Murthy, B.R. Moser, H.O. High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films |
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10.1016/j.surfcoat.2004.10.114 |
author2 |
SINGAPORE SYNCHROTRON LIGHT SOURCE |
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SINGAPORE SYNCHROTRON LIGHT SOURCE Yang, P. Lu, D. Murthy, B.R. Moser, H.O. |
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Article |
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Yang, P. Lu, D. Murthy, B.R. Moser, H.O. |
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Yang, P. |
title |
High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films |
title_short |
High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films |
title_full |
High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films |
title_fullStr |
High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films |
title_full_unstemmed |
High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k films |
title_sort |
high-resolution synchrotron x-ray reflectivity study of the density of plasma-treated ultra low-k films |
publishDate |
2014 |
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http://scholarbank.nus.edu.sg/handle/10635/113020 |
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1781789150474665984 |