The effect of intrinsic defects on resistive switching based on p-n heterojunction

10.1166/nnl.2013.1626

Saved in:
Bibliographic Details
Main Authors: Zheng, K., Sun, X.W., Teo, K.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/114534
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore