Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

10.1109/TDMR.2004.826387

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Bibliographic Details
Main Authors: Pey, K.L., Radhakrishnan, M.K., Trigg, A.
Other Authors: INSTITUTE OF MICROELECTRONICS
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/115420
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1154202023-10-26T07:29:50Z Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pey, K.L. Radhakrishnan, M.K. Trigg, A. INSTITUTE OF MICROELECTRONICS 10.1109/TDMR.2004.826387 IEEE Transactions on Device and Materials Reliability 4 1 4- 2014-12-12T07:15:24Z 2014-12-12T07:15:24Z 2004-03 Conference Paper Pey, K.L., Radhakrishnan, M.K., Trigg, A. (2004-03). Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE Transactions on Device and Materials Reliability 4 (1) : 4-. ScholarBank@NUS Repository. https://doi.org/10.1109/TDMR.2004.826387 15304388 http://scholarbank.nus.edu.sg/handle/10635/115420 000220708500001 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/TDMR.2004.826387
author2 INSTITUTE OF MICROELECTRONICS
author_facet INSTITUTE OF MICROELECTRONICS
Pey, K.L.
Radhakrishnan, M.K.
Trigg, A.
format Conference or Workshop Item
author Pey, K.L.
Radhakrishnan, M.K.
Trigg, A.
spellingShingle Pey, K.L.
Radhakrishnan, M.K.
Trigg, A.
Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
author_sort Pey, K.L.
title Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
title_short Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
title_full Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
title_fullStr Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
title_full_unstemmed Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
title_sort expanded papers from the 2003 ieee international symposium on the physical and failure analysis of integrated circuits (ipfa)
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/115420
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