Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
10.1109/TDMR.2004.826387
Saved in:
Main Authors: | , , |
---|---|
Other Authors: | |
Format: | Conference or Workshop Item |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/115420 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
id |
sg-nus-scholar.10635-115420 |
---|---|
record_format |
dspace |
spelling |
sg-nus-scholar.10635-1154202023-10-26T07:29:50Z Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pey, K.L. Radhakrishnan, M.K. Trigg, A. INSTITUTE OF MICROELECTRONICS 10.1109/TDMR.2004.826387 IEEE Transactions on Device and Materials Reliability 4 1 4- 2014-12-12T07:15:24Z 2014-12-12T07:15:24Z 2004-03 Conference Paper Pey, K.L., Radhakrishnan, M.K., Trigg, A. (2004-03). Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE Transactions on Device and Materials Reliability 4 (1) : 4-. ScholarBank@NUS Repository. https://doi.org/10.1109/TDMR.2004.826387 15304388 http://scholarbank.nus.edu.sg/handle/10635/115420 000220708500001 Scopus |
institution |
National University of Singapore |
building |
NUS Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NUS Library |
collection |
ScholarBank@NUS |
description |
10.1109/TDMR.2004.826387 |
author2 |
INSTITUTE OF MICROELECTRONICS |
author_facet |
INSTITUTE OF MICROELECTRONICS Pey, K.L. Radhakrishnan, M.K. Trigg, A. |
format |
Conference or Workshop Item |
author |
Pey, K.L. Radhakrishnan, M.K. Trigg, A. |
spellingShingle |
Pey, K.L. Radhakrishnan, M.K. Trigg, A. Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
author_sort |
Pey, K.L. |
title |
Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
title_short |
Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
title_full |
Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
title_fullStr |
Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
title_full_unstemmed |
Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
title_sort |
expanded papers from the 2003 ieee international symposium on the physical and failure analysis of integrated circuits (ipfa) |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/115420 |
_version_ |
1781789389875052544 |