Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
10.1109/TDMR.2004.826387
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Main Authors: | Pey, K.L., Radhakrishnan, M.K., Trigg, A. |
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Other Authors: | INSTITUTE OF MICROELECTRONICS |
Format: | Conference or Workshop Item |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/115420 |
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Institution: | National University of Singapore |
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